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Electronic Information Science and Technology
Optical Information Science and Technology
Electronic Science and Technology
Information Security
Electronic and Information Engineering
 
 
  
Yuankun Liu
2010-10-12

Yuankun Liu

Lecturer

Department: Optoelectronic Science and Technology
Office: Basic Teaching Building, A119
Phone: +86 28 8546 3879
Fax: +86 28 8546 4568
liu0041@sina.com, lyk@scu.edu.cn

Educational Background
l  B. S., Sichuan University, 1998.
l  M. S., Sichuan University, 2004.
l  Ph. D., Sichuan University, 2007.

Research & Teaching Interests
Lecturer Liu’s research is focused on three-dimensional (3D) optical sensing and optical information processing. In recent years, he dedicates himself on researching 3D shape measuring technology for specular surface, research contents include camera calibration as well as the measuring system calibration. He has worked as a visiting researcher in VTT Finland for 5 months in 2009. Now his research is currently supported by NSFC and VTT in Finland.
Lecturer Liu teaches two undergraduate courses every year, Matlab programming and application and Thin Film Optics technique.

Recent Publications

l  Yan Tang, Xianyu Su, Fan Wu, Yuankun Liu, A novel phase measuring deflectometry for aspheric mirror test, Optics Express, 2009, 17(22):19778-19784
l  Gu, Zheng; Su, Xianyu; Liu, Yuankun; Zhang, Qican, Local stereo matching with adaptive support-weight, rank transform and disparity calibration, Pattern recognition letters, 2009,29(9):1230-1235
l  Yuankun Liu, Xianyu Su, Qican Zhang, Study on Bi-color Phase Measurement Deflectometry, Proc. of SPIE,2009,7283,728349-1~4
l  Yan Tang, Xianyu Su, Yuankun Liu, Hailong Jing, 3D shape measurement of the aspheric mirror by advanced phase measuring deflectometry, Optics Express, 2008,16(19), 15090-15096,(SCI 000259271900081, EI083911588936)
l  Yuankun Liu, Xianyu Su, Qingyang Wu, Three-Dimensional shape measurement for specular surface based on fringe reflection. Acta Optica Sintica, 2006, 26(11), 1636-1640.
l  Yuankun Liu, Xianyu Su, Qingyang Wu, wavefront measurement for transparent object by active deflectometry. Chinese journal of lasers, 2007, 34(4), 515-518.


Professional experience & Activities

l  7/07-present  Lecturer, College of Electronics and Information Engineering, Sichuan University.

l  9/07-present  Committee Member - Opto-electronic Technology Committee of COS.
l  6/08-present  Member - Chinese Optical Society (COS).
l  6/08-present  Member - Optical Society of America (OSA).
l  6/08-present  Member - International Society for Optical Engineering (SPIE).

 
 
 College of Electronics And Information Engineering
Sichuan University
Mailing address: No. 24 South Section 1, 1st Ring Road,Chengdu, Sichuan, P. R. China
Email: einfo@scu.edu.cn
Phone: 86-028-85463873 85463872
Fax: 86-028-85463871
 
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